The computed tomography combines computer and x-ray detection technology to obtain information on the internal structure and surface features of devices without damage. By reconstructing the three-dimensional structure inside the device and quantitatively analyzing its mechanical properties, it can obtain information on the structure, composition, material, and defects. It is also a non-destructive testing technology for measurement and efficient analysis of devices.

Application
Integrated Circuits, Transistors, Resistors, Capacitors, Inductors, Transformers, Sensors, Electromechanical Components, Connectors, PCB, PCBA, Power Modules, Signal Modules, etc

Reference Standards
ASTM E1441-16; ISO 10360-8; VDI/VDE 2630; etc